Apparatus and method for detection and thickness measurement of

Details Apparatus and method for detection and thickness measurement of Apparatus and method for detection and thickness measurement of

1995-04-03

1998-07-14

Mullen, Thomas

Communications: electrical

Condition responsive indicating system

Specific condition

244134F, 340691, 34081565, 340962, G08B 1902

Patent

active

057811156

ABSTRACT:
The invention is to a system and method for detecting materials on a conductive surface and measuring the thickness and permittvity of the material. A polarized Radio Frequency signal is reflected from a conduction surface having a material thereon. The reflected de-polarized signal is then processed to determine the thickness and permittivity of the material on the conductive surface.

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National Technical Report (Japan) vol. 24, No. 3 Jun. 1978, Sato (Translation).

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