Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2008-01-29
2008-01-29
Bella, Matthew C. (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S108000, C382S152000
Reexamination Certificate
active
07324681
ABSTRACT:
The present invention is directed to solving the problems associated with the detection of surface defects on metal bars as well as the problems associated with applying metal flat inspection systems to metal bars for non-destructive surface defects detection. A specially designed imaging system, which is comprised of a computing unit, line lights and high data rate line scan cameras, is developed for the aforementioned purpose. The target application is the metal bars (1) that have a circumference/cross-section-area ratio equal to or smaller than 4.25 when the cross section area is unity for the given shape, (2) whose cross-sections are round, oval, or in the shape of a polygon, and (3) are manufactured by mechanically cross-section reduction processes. The said metal can be steel, stainless steel, aluminum, copper, bronze, titanium, nickel, and so forth, and/or their alloys. The said metal bars can be at the temperature when they are being manufactured.
REFERENCES:
patent: 3933532 (1976-01-01), Glomb
patent: 4118732 (1978-10-01), Ichijima et al.
patent: 4121294 (1978-10-01), Galanis et al.
patent: 4127815 (1978-11-01), Vild et al.
patent: 4139890 (1979-02-01), Yerkes et al.
patent: 4141071 (1979-02-01), Yerkes et al.
patent: 4219844 (1980-08-01), Ohsumi et al.
patent: 4223346 (1980-09-01), Neiheisel et al.
patent: 4237959 (1980-12-01), Yamamoto et al.
patent: 4319270 (1982-03-01), Kimura et al.
patent: 4338822 (1982-07-01), Yamaguchi et al.
patent: 4377238 (1983-03-01), Wilks et al.
patent: 4461995 (1984-07-01), Harris
patent: 4493859 (1985-01-01), Krantz
patent: 4495587 (1985-01-01), Plante et al.
patent: 4519041 (1985-05-01), Fant et al.
patent: 4534405 (1985-08-01), Hulek et al.
patent: 4561104 (1985-12-01), Martin
patent: 4635111 (1987-01-01), Moore
patent: 4665317 (1987-05-01), Ferrierre et al.
patent: 4759072 (1988-07-01), Yamane et al.
patent: 4837510 (1989-06-01), Tornblom
patent: 4853634 (1989-08-01), Tornblom
patent: 4926928 (1990-05-01), Leckie
patent: 4953710 (1990-09-01), Chen et al.
patent: 5068799 (1991-11-01), Jarrett, Jr.
patent: 5101461 (1992-03-01), Nakajima
patent: 5103722 (1992-04-01), Brengman et al.
patent: 5146311 (1992-09-01), Chang
patent: 5363901 (1994-11-01), Bjornestol et al.
patent: 5442285 (1995-08-01), Zombo et al.
patent: 5654977 (1997-08-01), Morris
patent: 5866820 (1999-02-01), Camplin et al.
patent: 5963918 (1999-10-01), Reagan et al.
patent: 6002251 (1999-12-01), Sun
patent: 6092059 (2000-07-01), Straforini et al.
patent: 6184924 (2001-02-01), Schneider et al.
patent: 6597455 (2003-07-01), Wlodarski et al.
patent: 6950546 (2005-09-01), Chang et al.
patent: 06-24174 (1994-09-01), None
patent: 06-241740 (1994-09-01), None
patent: 06-241740 (1994-09-01), None
patent: 2001-264032 (2001-09-01), None
patent: 2000-0042522 (2000-07-01), None
patent: 2001 0041454 (2001-05-01), None
patent: WO 99/54715 (1999-10-01), None
patent: WO 2004/051178 (2004-06-01), None
International Search Report for Application No. PCT/US03/38184 Mailed Jun. 29, 2005.
Written Opinion of IPEA for Application No. PCT/US03/38184 Mailed Oct. 12, 2005.
Judd, T.W., 1996, “On-Line Detection of Longitudinal Surface Defects,” Detection, Classification, and Elimination of Rod and Bar Surface Defects, American Iron and Steel Institute, pp. 17-20.
International Preliminary Report on Patentability Mailed Dec. 12, 2005 for PCT/US03/38184.
International Preliminary Report on Patentability Mailed Mar. 22, 2006 for PCT/US03/38184.
Chang Tzyy-Shuh
Gutchess Daniel
Huang Hsun-Hau
Bella Matthew C.
Dykema Gossett PLLC
OG Technologies, Inc.
Tucker Wes
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