Apparatus and method for detecting flaws in conductive material

Details Apparatus and method for detecting flaws in conductive material Apparatus and method for detecting flaws in conductive material

1997-12-02

1999-11-16

Snow, Walter E.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324262, G01N 2782, G01R 3312

Patent

active

059864524

ABSTRACT:
The present invention is an improved sensing unit for detecting flaws in conductive material wherein the sensing coil is positioned away from a datum of either the datum point, the datum orientation, or a combination thereof. Position of the sensing coil away from a datum increases sensitivity for detecting flaws having a characteristic volume less than about 1 mm.sup.3, and further permits detection of subsurface flaws. Use of multiple sensing coils permits quantification of flaw area or volume.

REFERENCES:
patent: 2519367 (1950-08-01), Gunn et al.
patent: 3881151 (1975-04-01), Bigelow
patent: 5777469 (1998-07-01), Hockey et al.

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