Apparatus and method for detecting and rejecting high...

Details Apparatus and method for detecting and rejecting high... Apparatus and method for detecting and rejecting high...

2005-04-12

2005-04-12

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

06879173

ABSTRACT:
A method and corresponding apparatus for detecting and rejecting high impedance failures in chip interconnects use monitoring circuitry on a chip to provide accurate and pro-active prediction of interconnect failures. The apparatus may include a resistance continuity monitoring circuit (RCMC), and a signal path connecting a representative set of pins to the RCMC. The RCMC measures the resistance of a connection of the representative set of pins with a circuit board during system operation and outputs a measured resistance data. The apparatus further includes additional analog-to-digital (A/D) hardware to perform an analog to digital conversion of the measured resistance data. Additional on-chip circuitry and/or microcode may be used to perform an algorithm on the digital resistance data to generate an interconnect status signal. For example, the method may output a failure signal when the measured resistance data exceeds a threshold resistance value. The apparatus further includes a system interface to send the interconnect status signal to other system management devices.

REFERENCES:
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patent: 5912901 (1999-06-01), Adams et al.
patent: 6000051 (1999-12-01), Nadeau-Dostie et al.
patent: 6029263 (2000-02-01), Gibson
patent: 6286119 (2001-09-01), Wu et al.

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