Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2011-03-01
2011-03-01
Feliciano, Eliseo Ramos (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S057000, C702S179000, C398S079000, C372S003000, C359S334000, C359S349000, C356S301000, C356S302000, C356S306000, C356S307000, C356S326000
Reexamination Certificate
active
07899650
ABSTRACT:
In one aspect, a signal processing system includes a processor, an I/O device operatively associated with the processor, and a memory device bearing instructions configured to cause the processor to obtain a representation of signal data over a data domain and position a sliding-window over a portion of the signal data, such portion corresponding to a sliding-window domain, to analyze the signal data within the sliding-window domain to detect the presence of a signature multiplet and, based on the analysis of the data, to estimate the pedestal of the signal data within the sliding-window domain. The instructions also cause the processor to iteratively shift the sliding-window over at least a portion of the data domain to correspondingly shift the sliding-window domain, estimate the pedestal of the signal data within each sliding-window domain to determine an estimated pedestal over the portion of the data domain, to subtract the estimated pedestal from the signal data to yield a pedestal-free representation of the signal data for the portion of the data domain, and to output the pedestal-free representation of the signal data for the portion of the data domain to a communication device, display, printing device, or data storage device.
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Morris Joel M.
Yeshwantpur Abhijit
Desta Elias
Feliciano Eliseo Ramos
Nixon & Peabody LLP
University of Maryland Baltimore County
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