Apparatus and method for detecting a pattern

Image analysis – Pattern recognition

Reexamination Certificate

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Details

C382S173000, C382S190000, C382S203000, C382S209000, C382S237000, C358S426040, C358S451000, C358S451000, C358S462000

Reexamination Certificate

active

07123768

ABSTRACT:
A method for detecting a specific pattern contained in an image. The pattern-detection method has steps of binarizing the input image data to obtain binary image data, recognizing a partial image that is contained in the binary image data, is part of the specific pattern, and has an empty inside, and determining the specific pattern contained in the image based on the recognition results. In the partial-image recognition step, a pixel-block area of predetermined size containing a target pixel is successively scanned for the binary image data, and a partial image contained in the binary image data is recognized on the condition that at least one OFF-pixel exists within a reference block consisting of the target pixel and predetermined pixels in its neighborhood within the block.

REFERENCES:
patent: 4395698 (1983-07-01), Sternberg et al.
patent: 4435836 (1984-03-01), Rubin
patent: 4644585 (1987-02-01), Crimmins et al.
patent: 4700401 (1987-10-01), Masatsugu et al.
patent: 4724543 (1988-02-01), Klevecz et al.
patent: 4821133 (1989-04-01), Gillies
patent: 4914709 (1990-04-01), Rudak
patent: 4941192 (1990-07-01), Mishima et al.
patent: 5048109 (1991-09-01), Bloomberg et al.
patent: 5091966 (1992-02-01), Bloomberg et al.
patent: 5128525 (1992-07-01), Stearns et al.
patent: 5168147 (1992-12-01), Bloomberg
patent: 5181255 (1993-01-01), Bloomberg
patent: 5201011 (1993-04-01), Bloomberg et al.
patent: 5202933 (1993-04-01), Bloomberg
patent: 5224179 (1993-06-01), Denker et al.
patent: 5390003 (1995-02-01), Yamaguchi et al.
patent: 5579445 (1996-11-01), Loce et al.
patent: 5590220 (1996-12-01), Takahashi
patent: 5600736 (1997-02-01), Hagita
patent: 5898795 (1999-04-01), Bessho
patent: 6272244 (2001-08-01), Takahashi et al.
patent: 6347156 (2002-02-01), Kamada et al.
patent: 6636635 (2003-10-01), Matsugu
patent: 11-053539 (1999-02-01), None

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