Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-09-11
2007-09-11
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
11426646
ABSTRACT:
An apparatus and method for providing a multi-core integrated circuit chip that reduces the cost of the package and board while optimizing performance of the cores for use with a single voltage plane. The apparatus and method of the illustrative embodiments make use of a dynamic burn-in technique that optimizes all of the cores on the chip to run at peak performance at a single voltage. Each core is burned-in with a customized burn-in voltage that provides uniform power and performance across the whole chip. This results in a higher burn-in yield and lower overall power in the integrated circuit chip. The optimization of the cores to run at peak performance at a single voltage is achieved through use of the negative bias temperature instability affects on the cores imparted by the burn-in voltages applied.
REFERENCES:
patent: 5420520 (1995-05-01), Anschel et al.
patent: 5804459 (1998-09-01), Bolam et al.
patent: 5872797 (1999-02-01), Theodoseau
patent: 6094059 (2000-07-01), Frankeny et al.
patent: 6731179 (2004-05-01), Abadeer et al.
patent: 6762617 (2004-07-01), Iwase et al.
patent: 6820029 (2004-11-01), Fang et al.
patent: 7159313 (2007-01-01), Sathe et al.
U.S. Appl. No. 11/469,550, filed Sep. 1, 2006, Capps, Jr. et al.
Audet Jean
Capps, Jr. Louis B.
Daves Glenn G.
Ferris Joanne
Haridass Anand
Gerhardt Diana R.
Nguyen Ha Tran
Nguyen Trung Q.
Walder, Jr. Stephen J.
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