Apparatus and method for compensating clock period...

Details Apparatus and method for compensating clock period... Apparatus and method for compensating clock period...

2006-03-27

2009-08-25

Nghiem, Michael P (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S089000

Reexamination Certificate

active

07580806

ABSTRACT:
An apparatus and method for compensating clock period elongation during scan testing in an integrated circuit (IC) includes operating a clock associated with the IC at a frequency (fTARGET) at which IC operation is sought to be determined, measuring the actual clock period (TCLOCK—OUT) at a clock output, scan testing the IC, measuring the actual clock period (TSCAN—CLOCK—OUT) at the clock output, determining a delay by calculating the difference between TSCAN—CLOCK—OUTand TCLOCK—OUT, and compensating for the delay by increasing the clock frequency during scan test.

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