Image analysis – Applications – Manufacturing or product inspection
Patent
1993-07-26
1997-04-08
Boudreau, Leo
Image analysis
Applications
Manufacturing or product inspection
382209, G06K 900
Patent
active
056195885
ABSTRACT:
A method for comparing first and second digital representations of an image, the method comprising the steps of: for each individual translation from among a plurality of translations from the first digital representation to the second digital representation: for each individual image location from among a plurality of image locations within a comparison entity within the first digital representation, determining a binary legitimacy value of the individual translation for the individual image location by comparing the individual image location to a location in the second digital representation defined by operating the individual translation on the individual image location; and combining the binary legitimacy values of image locations within the comparison entity, thereby to generate a comparison entity legitimacy value determining whether the individual translation is legitimate for the comparison entity; and announcing a defect for the comparison entity if none of the plurality of translations are legitimate therefor.
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Aloni Meir
Eran Yair
Kaplan Haim
Yolles Joel
Boudreau Leo
Kelley Chris
Orbot Instruments Ltd.
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