Apparatus and method for circuit analysis using magnetic and...

Details Apparatus and method for circuit analysis using magnetic and... Apparatus and method for circuit analysis using magnetic and...

2007-07-31

2007-07-31

Patidar, Jay M. (Department: 2862)

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

C324S237000, C324S228000

Reexamination Certificate

active

11120510

ABSTRACT:
A material analysis system configured to determine whether a circuit is defective includes a magnetic field generator configured to generate a first magnetic field that is configured to induce at least one eddy current in a conductive portion of the circuit, wherein the eddy current induces a second magnetic field; a set of magnetic field sensors configured to detect the second magnetic field and generate a set of image information therefrom; a database that includes circuit information for the circuit; and a computing device configured to receive the image information from the set of magnetic field sensors and retrieve the circuit information from the database, wherein the computing device is configured to compare the image information to the circuit information to determine whether the circuit is defective.

REFERENCES:
patent: 5218294 (1993-06-01), Soiferman
patent: 6975108 (2005-12-01), Bilik et al.
patent: 2003/0071615 (2003-04-01), Schlicker et al.
Kacprzak et al., Interpretation of Printed Circuit Boards Structures via Amplitude and signals phase Obtained from the ECT testings, 6thInternational workshop on Electromagnetic Non-Destructive Evaluation 2000.6.

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