Abrading – Abrading process – With tool treating or forming
Reexamination Certificate
1999-08-03
2001-05-08
Banks, Derris H. (Department: 3723)
Abrading
Abrading process
With tool treating or forming
C451S443000, C451S444000
Reexamination Certificate
active
06227947
ABSTRACT:
FIELD OF THE INVENTION
The present invention generally relates to an apparatus and a method for chemical mechanical polishing a semiconductor wafer and more particularly, relates to an apparatus and a method for chemical mechanical polishing a semiconductor wafer with extended polishing pad life by utilizing a second spray nozzle mounted juxtaposed to a conditioning pad for dispensing a first cleaning solution to substantially dissolve polishing debris during a pad conditioning process and then removing the dissolved debris by a second cleaning solution in a subsequent step.
BACKGROUND OF THE INVENTION
Apparatus for polishing thin, flat semi-conductor wafers is well-known in the art. Such apparatus normally includes a polishing head which carries a membrane for engaging and forcing a semiconductor wafer against a wetted polishing surface, such as a polishing pad. Either the pad, or the polishing head is rotated and oscillates the wafer over the polishing surface. The polishing head is forced downwardly onto the polishing surface by a pressurized air system or, similar arrangement. The downward force pressing the polishing head against the polishing surface can be adjusted as desired. The polishing head is typically mounted on an elongated pivoting carrier arm, which can move the pressure head between several operative positions. In one operative position, the carrier arm positions a wafer mounted on the pressure head in contact with the polishing pad. In order to remove the wafer from contact with the polishing surface, the carrier arm is first pivoted upwardly to lift the pressure head and wafer from the polishing surface. The carrier arm is then pivoted laterally to move the pressure head and wafer carried by the pressure head to an auxiliary wafer processing station. The auxiliary processing station may include, for example, a station for cleaning the wafer and/or polishing head; a wafer unload station; or, a wafer load station.
More recently, chemical-mechanical polishing (CMP) apparatus has been employed in combination with a pneumatically actuated polishing head. CMP apparatus is used primarily for polishing the front face or device side of a semiconductor wafer during the fabrication of semiconductor devices on the wafer. A wafer is “planarized” or smoothed one or more times during a fabrication process in order for the top surface of the wafer to be as flat as possible. A wafer is polished by being placed on a carrier and pressed face down onto a polishing pad covered with a slurry of colloidal silica or alumina in de-ionized water.
A schematic of a typical CMP apparatus is shown in
FIGS. 1A and 1B
. The apparatus
10
for chemical mechanical polishing consists of a rotating wafer holder
14
that holds the wafer
10
, the appropriate slurry
24
, and a polishing pad
12
which is normally mounted to a rotating table
26
by adhesive means. The polishing pad
12
is applied to the wafer surface
22
at a specific pressure. The chemical mechanical polishing method can be used to provide a planar surface on dielectric layers, on deep and shallow trenches that are filled with polysilicon or oxide, and on various metal films. CMP polishing results from a combination of chemical and mechanical effects. A possible mechanism for the CMP process involves the formation of a chemically altered layer at the surface of the material being polished. The layer is mechanically removed from the underlying bulk material. An altered layer is then regrown on the surface while the process is repeated again. For instance, in metal polishing a metal oxide may be formed and removed repeatedly.
A polishing pad is typically constructed in two layers overlying a platen with the resilient layer as the outer layer of the pad. The layers are typically made of polyurethane and may include a filler for controlling the dimensional stability of the layers. The polishing pad is usually several times the diameter of a wafer and the wafer is kept off-center on the pad to prevent polishing a non-planar surface onto the wafer. The wafer is also rotated to prevent polishing a taper into the wafer. Although the axis of rotation of the wafer and the axis of rotation of the pad are not collinear, the axes must be parallel. Polishing heads of the type described above used in the CMP process are shown in U.S. Pat. No. 4, 141180 to Gill, Jr., et al.; U.S. Pat. No. 5,205,082 to Shendon et al; and, U.S. Pat. No. 5,643,061 to Jackson, et al. It is known in the art that uniformity in wafer polishing is a function of pressure, velocity and the concentration of chemicals. Edge exclusion is caused, in part, by non-uniform pressure on a wafer. The problem is reduced somewhat through the use of a retaining ring which engages the polishing pad, as shown in the Shendon et al patent.
Referring now to
FIG. 1C
, wherein an improved CMP head, sometimes referred to as a Titan® head which differs from conventional CMP heads in two major respects is shown. First, the Titan® head employs a compliant wafer carrier and second, it utilizes a mechanical linkage (not shown) to constrain tilting of the head, thereby maintaining planarity relative to a polishing pad
12
, which in turn allows the head to achieve more uniform flatness of the wafer during polishing. The wafer
10
has one entire face thereof engaged by a flexible membrane
16
, which biases the opposite face of the wafer
10
into face-to-face engagement with the polishing pad
12
. The polishing head and/or pad
12
are moved relative to each other, in a motion to effect polishing of the wafer
10
. The polishing head includes an outer retaining ring
14
surrounding the membrane
16
, which also engages the polishing pad
12
and functions to hold the head in a steady, desired position during the polishing process. As shown in
FIG. 1C
, both the retaining ring
14
and the membrane
16
are urged downwardly toward the polishing pad
12
by a linear force indicated by the numeral
18
which is effected through a pneumatic system.
In the improved CMP head
20
shown in
FIG. 1C
, large variations in the removal rate, or polishing rate, across the whole wafer area are frequently observed. A thickness variation across the wafer is therefore produced as a mean cause for wafer non-uniformity. The improved CMP head design, even though utilizing a pneumatic system to force a wafer surface onto a polishing pad, the pneumatic system cannot selectively apply different pressure at different locations on the surface of the wafer. For instance, as shown in
FIG. 1D
, a profilometer data obtained on an 8-inch wafer is shown. The thickness difference between the highest point on the wafer and the lowest point on the wafer is almost 2,000 Å yielding a standard deviation of 472 Å, or 6.26%. The curve shown in
FIG. 1D
is plotted with the removal rates in the vertical axis and the distance from the center of the wafer in the horizontal axis. It is seen that the removal rates at the edges of the wafer are substantially higher than the removal rate at or near the center of the wafer. The thickness uniformity on the resulting wafer after the CMP process is therefore very poor.
The polishing pad
12
is a consumable item used in a semiconductor wafer fabrication process. For instance, under normal wafer fab conditions, the polishing pad must be replaced after a usage of between 12 and 18 hours. Polishing pads may be hard, incompressible pads or soft pads. For oxide polishing, hard, incompressible and thus stiffer pads are generally used to achieve planarity. Softer pads are frequently used to achieve improved uniformity and smooth surfaces. The hard pads and the soft pads may also be combined in an arrangement of stacked pads for customized applications.
A problem frequently encountered in using polishing pads in a CMP process for oxide planarization is the rapid deterioration in polishing rates of the oxide with successive wafers. The cause for the deterioration has been shown to be due to an effect known as “pad glazing” wherein the surface of the polishing pads become smooth
Chen Ying-Ho
Hu Tien-Chen
Shih Tsu
Twu Jih-Churng
Banks Derris H.
Taiwan Semiconductor Manufacturing Company Ltd
Thomas David B
Tung & Associates
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