Apparatus and method for characterizing pulsed light beams

Details Apparatus and method for characterizing pulsed light beams Apparatus and method for characterizing pulsed light beams

1999-02-05

2000-04-18

Dang, Hung Xuan

Optics: measuring and testing

Lamp beam direction or pattern

2502019, 2502081, G01J 100

Patent

active

060521805

ABSTRACT:
An apparatus and method for characterizing a pulsed energy beam with a two-dimensional wavefront sensor. The data acquisition is synchronized with the output of the beam from the pulsed source, so that a beam characterization, including phase, can be determined in a single pulse.

REFERENCES:
patent: 5493391 (1996-02-01), Neal et al.

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