Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2007-12-18
2007-12-18
Verbitsky, Gail (Department: 2859)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C374S172000, C374S001000, C702S130000, C702S099000, C327S513000
Reexamination Certificate
active
10952514
ABSTRACT:
A circuit for temperature sensing provides a bias current to a PN junction, and the PN junction provides a PN junction voltage in response to the bias current. Also, a parasitic resistance may be coupled in series with the PN junction. The circuit for temperature sensing is configured to determine the temperature of the PN junction based on the PN junction voltage. Further, the circuit includes registers which store ηtrim, which is based on the difference between the non-ideality of the PN junction used from a reference PN junction; ΔI, which is based on the difference between a reference bias current and the bias current for the part; Rtrim, which is based the parasitic resistance; and Ntrim, which includes other offsets. The registers may be set during trimming and/or calibration to provide accurate temperature sensing for the parameters employed.
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Aslan Mehmet
D'Aquino Dan
Ng Chungwai Benedict
Ren Qing Feng
Tam Eric
Darby & Darby PC
Gaffney Matthew M.
National Semiconductor Corporation
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