Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-01-09
2007-01-09
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S081000, C702S182000, C702S183000
Reexamination Certificate
active
10618056
ABSTRACT:
The invention is directed to a device for calibrating signals, whereby at least two signal circuits are provided for generating signals. In order to calibrate the signals, elements are provided that evaluate the signals generated by the signal circuits and, dependent thereon, drive at least one of the at least two signal circuits such that the time reference of the signals generated by the signal circuits relative to one another is set corresponding to at least one prescribed value.
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Hoff Marc S.
Schiff & Hardin LLP
Suarez Felix
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