Apparatus and method for batch property estimation

Details Apparatus and method for batch property estimation Apparatus and method for batch property estimation

2007-07-10

2007-07-10

Patel, Ramesh (Department: 2121)

Data processing: generic control systems or specific application

Generic control system, apparatus or process

Optimization or adaptive control

C700S029000, C700S031000, C700S044000, C700S046000, C703S002000, C706S012000, C706S016000, C706S028000

Reexamination Certificate

active

10449437

ABSTRACT:
A method and apparatus that generates an estimate of a property of a batch process uses a non-parametric model to generate a plurality of rate of reaction estimates associated with the batch process. Each rate of reaction estimate may correspond, for example, to a particular time during the batch process. The plurality of rate of reaction estimates are then integrated to generate an estimate of a property of the batch at the particular time.

REFERENCES:
patent: 3939328 (1976-02-01), Davis
patent: 4054780 (1977-10-01), Bartley et al.
patent: 4197576 (1980-04-01), Sanchez
patent: 4358822 (1982-11-01), Sanchez
patent: 5111531 (1992-05-01), Grayson et al.
patent: 5166873 (1992-11-01), Takatsu et al.
patent: 5248577 (1993-09-01), Jerome
patent: 5268835 (1993-12-01), Miyagaki et al.
patent: 5402333 (1995-03-01), Cardner
patent: 5442562 (1995-08-01), Hopkins et al.
patent: 5519605 (1996-05-01), Cawlfield
patent: 5659667 (1997-08-01), Buescher et al.
patent: 5673368 (1997-09-01), Broese et al.
patent: 5680409 (1997-10-01), Qin et al.
patent: 5682317 (1997-10-01), Keeler et al.
patent: 5687077 (1997-11-01), Gough, Jr.
patent: 5727128 (1998-03-01), Morrison
patent: 5740033 (1998-04-01), Wassick et al.
patent: 5752007 (1998-05-01), Morrison
patent: 5822220 (1998-10-01), Baines
patent: 5842189 (1998-11-01), Keeler et al.
patent: 5877954 (1999-03-01), Klimasauskas et al.
patent: 5933352 (1999-08-01), Salut
patent: 6056781 (2000-05-01), Wassick et al.
patent: 6088630 (2000-07-01), Cawlfield
patent: 6106785 (2000-08-01), Havlena et al.
patent: 6122557 (2000-09-01), Harrell et al.
patent: 6311093 (2001-10-01), Brown
patent: 6311095 (2001-10-01), Brown
patent: 6408227 (2002-06-01), Singhvi et al.
patent: 6440374 (2002-08-01), Jelinek et al.
patent: 6484133 (2002-11-01), Vogt
patent: 6490501 (2002-12-01), Saunders
patent: 6760716 (2004-07-01), Ganesamoorthi et al.
patent: 2001/0018643 (2001-08-01), Brown
patent: 2001/0027385 (2001-10-01), Brown
patent: 2001/0044710 (2001-11-01), Brown
patent: 2002/0035457 (2002-03-01), Brown
patent: 2002/0188582 (2002-12-01), Jannarone et al.
patent: 2003/0219797 (2003-11-01), Zhao et al.
patent: 2 186 715 (1987-08-01), None
patent: 2402232 (2004-12-01), None
patent: 2005004742 (2005-01-01), None
Search Report under Section 17(5) issued in GB0411361.9 application by the United Kingdom Patent Office on Sep. 17, 2004.
Cohen, “An Introduction to PROC LOESS for Local Regression,”SUGI Proceedings, 1999.
Fisher et al., “Learning Informative Statistics: A Nonparametric Approach,”Advances in Neural Information Processing Systems, 12, 1999.
Ihler et al., “Nonparametric Estimators for Online Signature Authentication,”In International Conference on Acoustics, Speech, and Signal Processing, May 2001.
Wikipedia, “Non-parametric Statistics,” Retrieved from the Internet on Jan. 17, 2007: <URL: http://en.wikipedia.org/wiki/Non-parametric—statistics>.

Affiliated with

Also associated with

Rating

Apparatus and method for batch property estimation does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for batch property estimation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for batch property estimation will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3773176