Image analysis – Pattern recognition – Feature extraction
Patent
1997-12-24
2000-01-11
Johns, Andrew W.
Image analysis
Pattern recognition
Feature extraction
382218, 382224, G06K 962
Patent
active
060144610
ABSTRACT:
An apparatus and method for automatic knowledge-based object or anomaly classification is provided by capturing a pixel map of an image and from that generating high level descriptors of the object or anomaly such as size, shape, color and sharpness. These descriptors are compared with sets of descriptors in a knowledge-base to classify the object or anomaly.
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Lin, YouLing, "Techniques for Syntactic Analysis of Images With Application for Automatic Visual Inspection," A Dissertation in Business Administration Submitted to the Graduate Faculty of Texas Tech University in Partial Fulfillment of the Requirements for the Degree of Doctor of Philosophy, Dec. 1990.
Hennessey Audrey Kathleen
Katragadda Ramachandra
Khaja Veera V. S.
Lin YouLing
Lu Huitian
Donaldson Richard L.
Johns Andrew W.
Texas Instruments Incorporated
Troike Robert L.
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