Apparatus and method for automated testing of a progammable anal

Details Apparatus and method for automated testing of a progammable anal Apparatus and method for automated testing of a progammable anal

1996-12-16

1999-01-19

Mullins, James B.

Amplifiers

With amplifier condition indicating or testing means

330124R, 324763, H03F 368, G01R 3102

Patent

active

058617744

ABSTRACT:
A Built-In Self-Test (BIST) circuit and test method are employed for automated testing of a programmable analog gain stage. The BIST circuit and operating method advantageously use the natural redundancy of a multiple-channel circuit for detecting circuit faults. More specifically, the BIST circuit utilizes the natural redundancy of the identical signal paths for multiple-channel, such as stereo, audio operation. A left channel and a right channel ideally function identically so that a fault in one channel of the left channel and the right channel signal paths is detected by mutually comparing the operation of the two channels.

REFERENCES:
patent: 4794343 (1988-12-01), Yang
A.K. Lu et al. "An Analog Multi-Tone Signal Generator For Built-In-Self-Test Applications", International Test Conference .COPYRGT. 1994 IEEE, Paper 27.3, pp. 650-659.
Eiichi Teraoka et al. "A Built-In-Self-Test for ADC and DAC in a Single-Chip Speech CODEC", International Test Conference .COPYRGT. 1993 IEEE, Paper 37.1, pp. 791-796.
R.J.A. Harvey et al. "Analogue Fault Simulation Based On Layout Dependent Fault Models", International Test Conference .COPYRGT. 1994 IEEE, Paper 27.2, pp. 641 and 648-649.
Ed Flaherty et al. "Design For Testability Of A Modular, Mixed Signal Family Of VLSI Devices" International Test Conference .COPYRGT. 1993 IEEE, Paper 37.2, pp. 797-808 and 813-814.
Mustapha Slamani et al. "An integrated Approach For Analog Circuit Testing With A Minimum Number Of Detected Parameters" International Test Conference .COPYRGT. 1994 IEEE, Paper 27.1, pp. 631-640.
Eric Kushnick, "Modular Mixed Signal Testing: High Speed Or High Resolution" International Test Conference .COPYRGT. 1994 IEEE, Paper 9.4, pp. 286-290.

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