Apparatus and method for analyzing paper surface topography

Details Apparatus and method for analyzing paper surface topography Apparatus and method for analyzing paper surface topography

1995-08-11

1997-11-04

Elmore, Reba I.

Boots, shoes, and leggings

36447102, 162198, 73159, G06F 1900, D21F 706

Patent

active

056847076

ABSTRACT:
This invention relates to an apparatus and method for identifying periodic roughness variations on a paper surface. Such devices of this type, generally, collect topography data from the paper surface, analyze the data, and compare the data with known signature topographies of paper machine clothing and equipment to determine the location in the paper manufacturing process where the periodic roughness variations on the paper surface are being produced.

REFERENCES:
patent: 4669300 (1987-06-01), Hall et al.
patent: 4692210 (1987-09-01), Forrester
patent: 4752897 (1988-06-01), Zoeller et al.
patent: 4888983 (1989-12-01), Dunfield et al.
patent: 4914309 (1990-04-01), Masaharu et al.
patent: 4965736 (1990-10-01), Balakrishnan
patent: 5122963 (1992-06-01), Chen
patent: 5358606 (1994-10-01), Makkonen
Form Talysurf Series "Form and Surface Texture Measurement", The Queens Award for Technical Achievement 1992, Rank Taylor Hobson 291-24E/0895 CS 20m. Printed in Eng.
"Multidimensional Digital Signal Processing," by D.E. Dudgeon and R.M. Mersereau, Prentice-Hall, Inc. Englewood Cliffs, New Jersey, 1984, pp. 28-33, 113-127.
"Measuring Fabric Mark in Board Using Image Analysis," by A.A. Koukoulas et al., Journal of Pulp and Paper Science, vol. 20, No. 8, pp. 220-225, Aug. 1994.
Fourier Analysis of Surface Roughness, by M. Brock, pp. 3-45, and "News from the Factory," pp. 46-49, Technical Review, Surface Roughness Analysis, No. 3, 1983, Bruel & Kjaer Instruments Inc. ISSN 007-2621.
"The effect of basestock structure on coating weight distribution," by H. Tomimasu, K. Suzuki and T. Ogura, and Philip Luner, Tappi Journal, Coating, May 1990, pp. 179-187.
S.J.I'Anson & H.W. Kropholler, "Enhancing Visibility of Wire-Mark by Image Analysis," Journal of Pulp and Paper Science, vol. 17, No. 1, Jan. 1991, pp. J22-J26.
M.A.MacGregor & T.E. Conners, Image Analysis of an LWC Paper Reveals Wire Mark in the Print Density Variations, TAPPI Proceedings, 1987 Engineering Conference, pp. 661-667.
The SCAPA Group, "Unaform Forming Fabrics . . . " etc. advertisement and Stephan I'Anson, Detection of periodic marks in paper and board by Image analysis, Pulp and Paper Journal, Dec. '93 (Circle 122) and pp. 72-76.
A. A. Koukoulas, N. Nguyen & B.D. Jordan, "Measuring Fabric Mark in Board Using Imgae Analysis", Journal of Pulp and Paper Science, vol. 20, No. 8, Aug. 94 pp. J220-J225.

Affiliated with

Also associated with

Rating

Apparatus and method for analyzing paper surface topography does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for analyzing paper surface topography, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for analyzing paper surface topography will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1838089