Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1991-02-25
1991-11-12
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324684, 324687, G01R 2726
Patent
active
050651064
ABSTRACT:
A parallel plate or single surface dielectric analyzer is disclosed including: a distance sensor for accurately measuring the varying distance between the electrodes, such as a linear voltage differential transformer (LVDT), and apparatus responsive to the distance sensor for positioning the electrodes; a force transducer for measuring the applied force on the sample and apparatus responsive to the force transducer to give a desired force by varying the electrode spacing; disposable electrodes made using thick film technology composed of a ceramic substrate with a conductor adhered to its surface; and a temperature sensor built into one of the electrodes such as a platinum ring adhered to the surface of one of the electrodes and apparatus to measure the resistance across the platinum ring.
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Hendrick Kendall
Reader, Jr. John R.
Harvey Jack B.
TA Instruments, Inc.
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