Apparatus and method for analyzing circuit specification...

Details Apparatus and method for analyzing circuit specification... Apparatus and method for analyzing circuit specification...

2011-03-15

2011-03-15

Doan, Nghia M (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Integrated circuit design processing

Logic design processing

C716S101000, C716S102000, C716S103000, C716S106000, C716S107000, C716S111000, C716S113000, C703S013000, C703S014000

Reexamination Certificate

active

07908577

ABSTRACT:
An apparatus for analyzing circuit specification description design has a circuit specification description inputting section that analyzes and obtains information of a related signal, information of the maximum number of cycles in the related signal, and a definite value in a site defined in the circuit specification description for the related signal contained in a circuit specification description, a data base generating section that generates signal variation data indicating time-series signal variation, wherein a definitive value is set in the site defined in the circuit specification description and a predetermined flag is set in a site where the value is not defined in the signal variation data, and a waveform diagram data outputting section that outputs waveform diagram data for displaying the time-series signal variation in a form of a waveform diagram on the basis of the definite value and the predetermined flag set in the data.

REFERENCES:
patent: 6675310 (2004-01-01), Bloom et al.
patent: 6983437 (2006-01-01), Lauritzen et al.
patent: 7100132 (2006-08-01), Hildebrant et al.
patent: 7107569 (2006-09-01), Ito
patent: 2001/0034594 (2001-10-01), Kohno et al.
patent: 2003/0125920 (2003-07-01), Matsuoka et al.
patent: 2003/0200519 (2003-10-01), Argyres

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