Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2006-11-10
2010-02-02
Stafira, Michael P (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
C356S237200
Reexamination Certificate
active
07656515
ABSTRACT:
Various apparatus and related methods are disclosed that are capable of detecting surface defects on an optical storage media. One example of an apparatus is configured to direct at least one light signal, which may be from one or more lasers, on an outer surface of an optical storage medium, such as a CD, DVD or the like, which includes encoded data. The light encounters both the optical storage media surface as well as any smudges, scratches, dents, or other defects thereon. Some or all of the light reflected from the defects and the surface are detected by one or more detectors, which may be a photodiode. The detector(s) produce an output signal commensurate with the detected reflected light, which output is processed to determine whether the encoded data may be accurately read from the optical storage media.
REFERENCES:
patent: 4954723 (1990-09-01), Takahashi et al.
patent: 5248973 (1993-09-01), Babu et al.
patent: 6262432 (2001-07-01), Brunfeld et al.
patent: 6721248 (2004-04-01), Kubo et al.
patent: 7016031 (2006-03-01), Meeks
patent: 7061601 (2006-06-01), Meeks
patent: 7289405 (2007-10-01), Kim et al.
patent: 7403279 (2008-07-01), Tohyama et al.
patent: 1522846 (2005-04-01), None
patent: 1679504 (2006-07-01), None
patent: 2299404 (1996-10-01), None
patent: 60166809 (1985-08-01), None
patent: 62163952 (1987-07-01), None
patent: 02163639 (1990-06-01), None
patent: WO2005040775 (2008-05-01), None
International Search Report, PCT/US06/60802, 8 pages, Feb. 6, 2008.
European Search Report, EP06846278.7, 11 pages, Dec. 2, 2008.
Aufderheide Jeffrey Alan
Eckerman James Henry
Freeman Ian Blair
Meyer John Clarence
Partee Charles Calvin Brooks
CheckFlix, Inc.
Dorsey & Whitney LLP
Stafira Michael P
LandOfFree
Apparatus and method for analysis of optical storage media does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for analysis of optical storage media, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for analysis of optical storage media will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4218653