Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2003-03-20
2008-08-05
Bella, Matthew C (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S144000, C715S838000
Reexamination Certificate
active
07409081
ABSTRACT:
An inspection system1includes an image pickup apparatus2for picking up an image of a defect, an inspection and classification apparatus4for performing inspection and automatic classification of defects, and a host computer5. The host computer5performs learning for automatic classification at the inspection and classification apparatus4. For creation of training data to be used for learning, defect images are arranged on a display of the host computer5on the basis of sizes of defects or imaging positions for picking up images of defects. A visual sign is provided to the defect image indicating a category assigned thereto. Further, in response to an operation by an operator, a statistical value of feature values of defect images included in a category, data obtained in inspection, images after being subjected to image processing, similar images or dissimilar images similar to or dissimilar to a defect image targeted for classification, an area directed to calculation of feature values in a defect image targeted for classification, and the like, are suitably displayed.
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Bella Matthew C
Dainippon Screen Mfg. Co,. Ltd.
McDermott Will & Emery LLP
Perungavoor Sath V.
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