Metal working – Method of mechanical manufacture – Electrical device making
Reexamination Certificate
2005-11-01
2005-11-01
Arbes, Carl J. (Department: 3729)
Metal working
Method of mechanical manufacture
Electrical device making
C029S595000, C029S825000
Reexamination Certificate
active
06959481
ABSTRACT:
A probe for non-destructive determination of complex permittivity of a material and for near field optical microscopy is based on a balanced multi-conductor transmission line structure created on a dielectric substrate member which confines the probing field within a sharply defined sampling volume in the material under study. A method for manufacturing dielectric support member based probes includes anisotropically depositing a 50-100 Å thick underlayer of Cr, Ni, W or Ta onto the dielectric support member, anisotropically depositing conductive material onto the Cr, Ni, W or Ta underlayer, and removing the unwanted conductive material at the sides of the dielectric support member to electrically isolate the created conductive strips.
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Christen Hans M.
Moreland Robert L.
Schwartz Andrew R.
Talanov Vladimir V.
Arbes Carl J.
Neocera, Inc.
Rosenberg , Klein & Lee
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