Aperture device for measuring thin films

Radiant energy – Invisible radiant energy responsive electric signalling – With means to inspect passive solid objects

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250308, 250393, G01N 23225, G21K 102

Patent

active

044750412

ABSTRACT:
An aperture device for measuring thin films has an aperture ring, of a material and thickness that is impenetrable by the radiation from radionuclides. The ring has a passage for emitted and reflected radiation extending approximately perpendicular to said ring, and a radiation device consisting of at least one collimating radiation source holder comprising a tube of a predetermined diameter that is permeable to radiation in the forward direction and has sides and a back that are impermeable to radiation and houses a radionuclide. The forward end surface of the tube lies behind the forward end surface of the passage. The cross-section of the passage is large compared to the cross-section of the radionuclide. A partition divides the passage into at least two chambers that are open at their rearward and forward ends. The partition has partition walls that are impermeable to radiation. The radiation source holder is arranged in one of the chambers, the cross-section of which chamber is a multiple of the cross-section of the radiation source holder. The forward end surface of the radiation source holder lies behind the forward end surface of the partition.

REFERENCES:
patent: 3319067 (1967-05-01), Joffe et al.
patent: 3705305 (1972-12-01), Fischer
patent: 3714436 (1973-01-01), Fischer
patent: 4317997 (1982-03-01), Tiebor et al.
patent: 4406948 (1983-09-01), Fischer et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Aperture device for measuring thin films does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Aperture device for measuring thin films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Aperture device for measuring thin films will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-528077

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.