APC process parameter estimation

Chemical apparatus and process disinfecting – deodorizing – preser – Analyzer – structured indicator – or manipulative laboratory... – Automatic analytical monitor and control of industrial process

Reexamination Certificate

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C422S083000, C422S177000, C422S172000, C436S055000, C700S266000, C700S267000, C700S052000, C700S048000, C700S051000, C700S054000, C423S235000, C423S237000, C423S242100

Reexamination Certificate

active

07862771

ABSTRACT:
A virtual analyzer is provided to estimate either an attribute of a reactant applied during performance of, or an amount of a reactant exhausted by, a process having multiple process parameters (MPPs) that is performed to control an amount of a pollutant emitted into the air. The virtual analyzer includes an interface which receives signals corresponding to attributes of the MPPs. If the process is a wet flue gas desulfurization (WFGD) process, the signals include a signal corresponding to a measured pH level of the applied reactant. If the process is a selective catalytic reduction (SCR) process, the signals include a signal corresponding to a measured amount of the reactant exhausted by the process.

REFERENCES:
patent: 4423018 (1983-12-01), Lester et al.
patent: 4487784 (1984-12-01), Kuroda et al.
patent: 4836991 (1989-06-01), Ishiguro et al.
patent: 5167009 (1992-11-01), Skeirik
patent: 5212765 (1993-05-01), Skeirik
patent: 5282261 (1994-01-01), Sheirik
patent: 5386373 (1995-01-01), Keeler et al.
patent: 5479573 (1995-12-01), Keeler et al.
patent: 5548528 (1996-08-01), Keeler et al.
patent: 5605552 (1997-02-01), Shimizu et al.
patent: 5635149 (1997-06-01), Klingspor et al.
patent: 5729661 (1998-03-01), Keeler et al.
patent: 5770161 (1998-06-01), Ochi et al.
patent: 5770166 (1998-06-01), Shimizu et al.
patent: 5781432 (1998-07-01), Keeler et al.
patent: 5933345 (1999-08-01), Martin et al.
patent: 6002839 (1999-12-01), Keeler et al.
patent: 6047221 (2000-04-01), Piche et al.
patent: 6168709 (2001-01-01), Etter
patent: 6243696 (2001-06-01), Keeler et al.
patent: 6278899 (2001-08-01), Piche et al.
patent: 6493596 (2002-12-01), Martin et al.
patent: 6542852 (2003-04-01), Chen et al.
patent: 6611726 (2003-08-01), Crosswhite
patent: 6625501 (2003-09-01), Martin et al.
patent: 6656440 (2003-12-01), Takashina et al.
patent: 6662185 (2003-12-01), Stark et al.
patent: 6746237 (2004-06-01), Storm et al.
patent: 6856855 (2005-02-01), Hirata et al.
patent: 6865509 (2005-03-01), Hsiung et al.
patent: 6882940 (2005-04-01), Potts et al.
patent: 6985779 (2006-01-01), Hsiung et al.
patent: 7113835 (2006-09-01), Boyden et al.
patent: 7323036 (2008-01-01), Boyden et al.
patent: 2004/0098974 (2004-05-01), Nieuwstadt et al.
patent: 2004/0249480 (2004-12-01), Lefebvre et al.
patent: 2005/0131620 (2005-06-01), Bowyer
patent: 2005/0265417 (2005-12-01), Fallon et al.
patent: 2006/0042525 (2006-03-01), Lefebvre et al.
patent: 2006/0052902 (2006-03-01), Lefebvre et al.
patent: 2006/0153761 (2006-07-01), Bandl-Konrad et al.
patent: 2006/0178762 (2006-08-01), Wroblewski et al.
patent: 0296500 (1988-12-01), None
patent: 0866395 (1998-09-01), None
patent: 1382905 (2004-01-01), None
patent: 109897/78 (1978-09-01), None
patent: 290036/96 (1996-11-01), None
patent: 2001-249705 (2001-09-01), None
patent: 2003-144852 (2003-05-01), None
patent: WO 03/065135 (2003-08-01), None
patent: WO 2004061278 (2004-07-01), None
Tran, et al., “Dynamic Matrix Control on Benzene and Toluene Towers”, Oct. 1989.
O'Conner, et al., “Application of a Single Multivariable Controller to Two Hydrocracker Distillation Columns in Series”, Oct. 1991.
Brown, et al., “Adaptive, Predictive Controller for Optimal Process Control”, Los Almost National Laboratory, Los Alamos, NM, 1993.
Boyden, et al., “The Development of DMCix: The AxM-based (DMC)™ Controller Interface”, Honeywell OpenUSE Technical Exchange Seminar, Mar. 1995.
Boyden “Controlled Variable Predictions with DMI: Temperature to Analyzer Predictors”, Jun. 1995.
Bequette, Model Predictive Control—References (Aug. 2000).
B. Hacking, “Advanced Control of Selective Catalytic Reduction (SCR) Literature and Patent Review”, Pegasus Technologies Technical Report, Mar. 2003.
B. Hacking, “Advanced Control of Wet Flue Gas Desulfurization Literature and Patent Review”, Pegasus Technologies Technical Report, Apr. 2003.

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