Antistatic mask for use with electronic test apparatus

Details Antistatic mask for use with electronic test apparatus Antistatic mask for use with electronic test apparatus

1988-11-25

1990-05-22

Ryan, Patrick

Stock material or miscellaneous articles

Structurally defined web or sheet

Including aperture

428211, 428413, 4285375, 428922, 430 5, 430 23, B32B 300

Patent

active

049276921

ABSTRACT:
A laminated antistatic electrical test mask for use with bed-of-nails test equipment in analyzing electrical properties between locations on a circuit board or card wherein the mask material prevents unused probes from contacting the product to be tested. The mask includes a plurality of layers comprised alternatively of cured glass cloth and a hygroscopic material, with a plurality of apertures disposed through the mask for receipt of test probes. In a particular embodiment, the layers are comprised of prepreg and a cellulose-containing material such as bonded paper. Electrostatic charges are more evenly distributed throughout the multiple layers of the composition to reduce charge densities presented to the test probes thereby significantly reducing destruction of JFETs associated with the probes from electrostatic discharge therethrough.

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