Antireflective hard mask compositions

Etching a substrate: processes – Forming or treating electrical conductor article – Forming or treating resistive material

Reexamination Certificate

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Details

C430S327000, C430S270100, C430S271100, C430S272100, C430S273100, C430S014000, C430S018000

Reexamination Certificate

active

06890448

ABSTRACT:
New organic-based radiation absorbing compositions are provided that are suitable for use as an antireflective coating composition (“ARC”) for an overcoated photoresist. These compositions also serve effectively as a hard mask layer by exhibiting a sufficient plasma etch selectively from an undercoated dielectric layer.

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