Antenna near-field probe station scanner

Communications: radio wave antennas – Antennas – Measuring signal energy

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07876276

ABSTRACT:
A miniaturized antenna system is characterized non-destructively through the use of a scanner that measures its near-field radiated power performance. When taking measurements, the scanner can be moved linearly along the x, y and z axis, as well as rotationally relative to the antenna. The data obtained from the characterization are processed to determine the far-field properties of the system and to optimize the system. Each antenna is excited using a probe station system while a scanning probe scans the space above the antenna to measure the near field signals. Upon completion of the scan, the near-field patterns are transformed into far-field patterns. Along with taking data, this system also allows for extensive graphing and analysis of both the near-field and far-field data. The details of the probe station as well as the procedures for setting up a test, conducting a test, and analyzing the resulting data are also described.

REFERENCES:
patent: 4704614 (1987-11-01), Poirier et al.
patent: 5270723 (1993-12-01), Lopez et al.
patent: 5365241 (1994-11-01), Williams et al.
patent: 5394157 (1995-02-01), Garneski
patent: 5410319 (1995-04-01), Lopez et al.
patent: 5477229 (1995-12-01), Caille et al.
patent: 5485158 (1996-01-01), Mailloux et al.
patent: 5844414 (1998-12-01), Eriksson et al.
patent: 6181285 (2001-01-01), Sullivan et al.
patent: 6191744 (2001-02-01), Snow et al.
patent: 6249248 (2001-06-01), Kitayoshi
patent: 6285330 (2001-09-01), Perl
patent: 6329953 (2001-12-01), McKivergan
patent: 6459409 (2002-10-01), Kohno et al.
patent: 6570539 (2003-05-01), Snow et al.
patent: 6636173 (2003-10-01), Graham
patent: 7035594 (2006-04-01), Wallace et al.
patent: 2002/0027526 (2002-03-01), Kohno et al.
patent: 2002/0171583 (2002-11-01), Purdy et al.
patent: 2003/0038747 (2003-02-01), Patel et al.
patent: 2003/0117315 (2003-06-01), Graham
patent: 2004/0155824 (2004-08-01), Nagashima
patent: 2005/0046608 (2005-03-01), Schantz et al.
patent: 2005/0253762 (2005-11-01), Tsai et al.
Measurement of Near Fields of Antennas and Scatterers,by John Dyson, IEEE Transactions on Antennas and propagation, vol. AP-21, No. 4, Jul. 1973.
Determination of Far-Field Antenna Patterns From Near-Field Measurements by Johnson et al; Proceedings of the IEEE, vol. 61, No. 12, Dec. 1973.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Antenna near-field probe station scanner does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Antenna near-field probe station scanner, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Antenna near-field probe station scanner will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2726665

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.