Antenna mirror-surface measuring system

Communications: directive radio wave systems and devices (e.g. – Directive – Including antenna pattern plotting

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343703, H01Q 300

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active

053749340

ABSTRACT:
A positioner supports an antenna at an optional rotating angle and the mirror surface of the antenna at different rotating angles is measured. A computer expands the measured value into series using polar coordinates system associated with the measuring system, whereby the intrinsic deformation of the mirror surface under the zero-gravity condition and the deformation due to gravity are separately measured.

REFERENCES:
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patent: 4201987 (1980-05-01), Tricoles et al.
patent: 4553145 (1985-11-01), Evans
patent: 4754496 (1988-06-01), Fishkin et al.
Davies et al, "Field Probe For Measuring Both Amplitude And Phase Of Antenna Radiation Patterns", Elec. Letters Nov. 6, 1980. vol. 16, No. 23.
Gipson et al, "Surface Accuracy of the ATS-2 Antenna Using Microwave Holography", Interferometrics Inc, Mar. 1, 1989 p. 7.
Rahmat-Samii, "Microwave Holography of Large Reflector Antennas--Simulation Algorithms", IEEE Trans. on Ant. and Prop. AP-33 No. 11, Nov. 1985.
Bennett et al, "Microwave Holographic Meterology of Large Reflector Antennas", IEEE Trans. on Ant. and Prop. AP-24, No. 3, May 1976.
Rhoades et al, "Large Millimeter Wave Antenna Systems", Microwave Systems News, Dec. 1988.
Electronics Letters, vol. 22, No. 19, Sep. 1986, Great Britain, pp. 977-978, Grattan et al. Microwave Holographic Technique for Reflector Antenna Profile Measurement.
Bibliothek Des Deutschen Patentamtes w/translation.
Bibliothek Des Deutschen Patentamtes, Measurement of Reflector Accuracy of the 30-m Millimeter Radio Telescope. Baars & Harth.
Bibliothek Des Deutschen Patentamtes, Radiation Properties of a Sar Antenna Panel Determined by Planar . . . Klooster.
"Antenna Engineering Handbook", 1980, pp. 448 to 459.

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