Anode and cathode connections for the practice of electromigrati

Metal treatment – Barrier layer stock material – p-n type – With contiguous layer doped to degeneracy

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29584, 29585, 29590, 148 333, 148 334, 148 336, 156602, 204130, 204140, 204292, 204294, 428620, H01L 2128

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045499128

ABSTRACT:
In the electromigration process, liquid metal inclusions are migrated into or through bodies of semiconductor material by an electrical potential gradient driving force. The method of this invention provides anode and cathode connections generally useful in the practice of electromigration and connections which are especially useful in circumventing the adverse effects of several types of rectifying junctions encountered in the practice of electromigration.

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patent: 4377423 (1983-03-01), Anthony
patent: 4381598 (1983-05-01), Anthony

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