Metal treatment – Barrier layer stock material – p-n type – With contiguous layer doped to degeneracy
Patent
1982-12-13
1985-10-29
Ozaki, G.
Metal treatment
Barrier layer stock material, p-n type
With contiguous layer doped to degeneracy
29584, 29585, 29590, 148 333, 148 334, 148 336, 156602, 204130, 204140, 204292, 204294, 428620, H01L 2128
Patent
active
045499128
ABSTRACT:
In the electromigration process, liquid metal inclusions are migrated into or through bodies of semiconductor material by an electrical potential gradient driving force. The method of this invention provides anode and cathode connections generally useful in the practice of electromigration and connections which are especially useful in circumventing the adverse effects of several types of rectifying junctions encountered in the practice of electromigration.
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Davis Jr. James C.
General Electric Company
Magee Jr. James
Ozaki G.
Rochford Paul E.
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