Annular x-ray inspection system

X-ray or gamma ray systems or devices – Specific application – Absorption

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250366, 250367, 250368, G03B 3500, G01T 120

Patent

active

048457698

ABSTRACT:
A high energy imaging system provides a "slotted" or "slot-shaped" or "rectangular cross-section" beam of illumination to intercept an annular region of an object of revolution as it is rotated. A detector array is located to intercept the illumination beam emanating from the object. The detector array includes an opto-electric transducer imaging a plurality of scintillating optical fiber or fiber bundles. The optical fiber or fiber bundles are located substantially parallel to each other with longitudinal axes substantially perpendicular to the direction of the illuminating radiation and parallel to the longitudinal axis of the object being imaged.

REFERENCES:
patent: 3225193 (1965-12-01), Hilton et al.
patent: 3766387 (1973-10-01), Heffan et al.
patent: 4092537 (1978-05-01), Stewart
patent: 4303860 (1981-12-01), Bjorkholm et al.
patent: 4415928 (1983-11-01), Strolle et al.
patent: 4580054 (1986-04-01), Shimoni

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Annular x-ray inspection system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Annular x-ray inspection system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Annular x-ray inspection system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-858610

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.