Electric resistance heating devices – Heating devices – Radiant heater
Reexamination Certificate
2006-05-16
2008-12-16
Fuqua, Shawntina (Department: 3742)
Electric resistance heating devices
Heating devices
Radiant heater
C219S390000, C219S405000, C219S411000, C392S418000, C392S307000, C118S724000, C118S725000, C118S728000, C118S729000, C118S730000, C438S458000, C438S459000, C438S455000, C438S479000, C438S480000, C438S798000, C438S799000
Reexamination Certificate
active
07466907
ABSTRACT:
A device for use in a thermal annealing process for a wafer (T) of material chosen among the semiconductor materials for the purpose of detaching a layer from the wafer at an weakened zone. During annealing, the device applies (1) a basic thermal budget to the wafer, with the basic thermal budget being slightly inferior to the budget necessary to detach the layer, this budget being distributed in an even manner over the weakened zone; and (2) an additional thermal budget is also applied to the wafer locally in a set region of the weakened zone so as to initiate the detachment of the layer in this region.
REFERENCES:
patent: 5616264 (1997-04-01), Nishi et al.
patent: 5985742 (1999-11-01), Henley et al.
patent: 5994207 (1999-11-01), Henley et al.
patent: 6010579 (2000-01-01), Henley et al.
patent: 6013563 (2000-01-01), Henley et al.
patent: 6013567 (2000-01-01), Henley et al.
patent: 6033974 (2000-03-01), Henley et al.
patent: 6035101 (2000-03-01), Sajoto et al.
patent: 6048411 (2000-04-01), Henley et al.
patent: 6146979 (2000-11-01), Henley et al.
patent: 6155909 (2000-12-01), Henley et al.
patent: 6159824 (2000-12-01), Henley et al.
patent: 6159825 (2000-12-01), Henley et al.
patent: 6162705 (2000-12-01), Henley et al.
patent: 6187110 (2001-02-01), Henley et al.
patent: 6245161 (2001-06-01), Henley et al.
patent: 6284631 (2001-09-01), Henley et al.
patent: 6290804 (2001-09-01), Henley et al.
patent: 6291313 (2001-09-01), Henley et al.
patent: 6294814 (2001-09-01), Henley et al.
patent: 6335264 (2002-01-01), Henley et al.
patent: 6391740 (2002-05-01), Cheung et al.
patent: 6458672 (2002-10-01), Henley et al.
patent: 6486041 (2002-11-01), Henley et al.
patent: 6511899 (2003-01-01), Henley et al.
patent: 6528391 (2003-03-01), Henley et al.
patent: 6558802 (2003-05-01), Henley et al.
patent: 2001/0035124 (2001-11-01), Okayama et al.
patent: 2002/0055266 (2002-05-01), Henley et al.
patent: 2002/0056519 (2002-05-01), Henley et al.
patent: 2002/0081823 (2002-06-01), Cheung et al.
patent: 2002/0106870 (2002-08-01), Henley et al.
patent: 2002/0115264 (2002-08-01), Henley et al.
patent: 0291147 (1988-03-01), None
patent: 0 291 147 (1988-11-01), None
patent: 1 100 127 (2001-05-01), None
patent: 1 256 973 (2002-11-01), None
patent: 1 258 909 (2002-11-01), None
patent: WO 99/49501 (1999-09-01), None
patent: WO 01/63002 (2001-08-01), None
US 6,413,837, 07/2002, Henley et al. (withdrawn)
Lin, C.-T., et al., “Temperature control of rapid thermal processing system using adaptive fuzzy network,”Fuzzy Sets and Systems, vol. 103, pp. 49-65 (1999).
Schwarzenbach Walter
Waechter Jean-Marc
Fuqua Shawntina
S.O.I.Tec Silicon on Insulator Technologies
Winston & Strawn LLP
LandOfFree
Annealing process and device of semiconductor wafer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Annealing process and device of semiconductor wafer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Annealing process and device of semiconductor wafer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4023306