Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Software program
Reexamination Certificate
2006-08-15
2006-08-15
Ferris, Fred (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Software program
C703S013000, C703S016000, C703S017000, C714S006130, C714S039000, C714S741000, C716S030000
Reexamination Certificate
active
07092868
ABSTRACT:
A method and system for resolving testcase collection inconsistencies between a testcase list which includes testcases that have triggered harvest events within a simulation model, and a harvest hit table which records harvest events that have been triggered during simulation of the simulation model. First, the harvest hit table is updated from a simulation client to include a harvest event triggered by a testcase during simulation of the simulation model. The testcase is then collected within the testcase list. Finally, testcases identified within the testcase list are compared to testcases identified within the harvest hit table to determine inconsistencies therebetween.
REFERENCES:
patent: 4914612 (1990-04-01), Beece et al.
patent: 5403639 (1995-04-01), Belsan et al.
patent: 5467462 (1995-11-01), Fujii
patent: 5604895 (1997-02-01), Raimi
patent: 5850345 (1998-12-01), Son
patent: 5910903 (1999-06-01), Feinberg et al.
patent: 6011920 (2000-01-01), Edwards et al.
patent: 6044398 (2000-03-01), Marullo et al.
patent: 6065046 (2000-05-01), Feinberg et al.
patent: 6157947 (2000-12-01), Watanabe et al.
patent: 6163763 (2000-12-01), Cox et al.
patent: 6182245 (2001-01-01), Akin et al.
patent: 6189116 (2001-02-01), Mongan et al.
patent: 6195627 (2001-02-01), Bargh et al.
patent: 6195629 (2001-02-01), Bargh et al.
patent: 6212667 (2001-04-01), Geer et al.
patent: 6223142 (2001-04-01), Bargh et al.
patent: 6292909 (2001-09-01), Hare
patent: 6336087 (2002-01-01), Burgun et al.
patent: 6353897 (2002-03-01), Nock et al.
patent: 6360335 (2002-03-01), Dawson
patent: 6421822 (2002-07-01), Pavela
patent: 6466898 (2002-10-01), Chan
patent: 6470478 (2002-10-01), Bargh et al.
patent: 6484135 (2002-11-01), Chin et al.
patent: 6516342 (2003-02-01), Feldman et al.
patent: 6539503 (2003-03-01), Walker
patent: 6560720 (2003-05-01), Chirashnya et al.
patent: 6560721 (2003-05-01), Boardman et al.
patent: 6567983 (2003-05-01), Shiimori
patent: 6640244 (2003-10-01), Bowman-Amuah
patent: 6651204 (2003-11-01), Rajsuman et al.
patent: 6678643 (2004-01-01), Turnquist et al.
patent: 6732338 (2004-05-01), Crouse et al.
patent: 6785773 (2004-08-01), Farago et al.
patent: 6839751 (2005-01-01), Dietz et al.
patent: 6859770 (2005-02-01), Ramsey
patent: 6934885 (2005-08-01), Gabele et al.
patent: 2001/0010091 (2001-07-01), Noy
patent: 2001/0011212 (2001-08-01), Raynaud et al.
patent: 2002/0162059 (2002-10-01), McNeely et al.
patent: 2002/0184326 (2002-12-01), Thomson
patent: 2003/0101035 (2003-05-01), Gabele et al.
patent: 2003/0101038 (2003-05-01), Gabele et al.
patent: 2003/0101039 (2003-05-01), Gabele et al.
patent: 2003/0101041 (2003-05-01), Gabele et al.
patent: 2003/0135354 (2003-07-01), Gabele et al.
patent: 2004/0078742 (2004-04-01), Emek et al.
patent: 2004/0261050 (2004-12-01), Broberg et al.
IBM technical Disclosure Bulletin, Automated Pervasive Device Testing Tool, Mar. 1, 2000,issue No. 431, p. No. 546.
Automated Pervasive Device Testing Tool, IBM Technical Disclosure Bulletin, Mar. 1, 2000.
Gabele Carol Ivash
Roesner Wolfgang
Williams Derek Edward
Dillon & Yudell LLP
Ferris Fred
Gebresilassie Kibrom K.
Salys Casimer K.
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