Anisotropic magnetoresistance measurement apparatus and method t

Details Anisotropic magnetoresistance measurement apparatus and method t Anisotropic magnetoresistance measurement apparatus and method t

1988-01-20

1989-02-07

Buczinski, Stephen C.

Electricity: measuring and testing

Magnetic

Magnetometers

324244, G01R 3302

Patent

active

H00005851

ABSTRACT:
The present invention is an apparatus and method for the non-destructive ting of the anisotropic magnetoresistance parameters of a film. A plurality of contacts points are securely disposed in a generally planar support means and engagable with a surface of the film for measuring the anisotropic magnetoresistance parameters of the film in accord with a predetermined equation.

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