Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2009-06-29
2011-10-04
Nguyen, Sang (Department: 2886)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
C356S301000, C250S339020, C250S458100, C359S308000
Reexamination Certificate
active
08031337
ABSTRACT:
An angularly resolved scatterometer uses a broadband radiation source and an acousto-optical tunable filter to select one or more narrowband components from the broadband beam emitted by the source for use in measurements. A feedback loop can be used to control the intensity of the selected narrowband components to reduce noise.
REFERENCES:
patent: 4771629 (1988-09-01), Carlson et al.
patent: 5111038 (1992-05-01), Taylor et al.
patent: 5216484 (1993-06-01), Chao et al.
patent: 5357097 (1994-10-01), Shiozawa et al.
patent: 5377003 (1994-12-01), Lewis et al.
patent: 5410371 (1995-04-01), Lambert
patent: 5438406 (1995-08-01), Puschell
patent: 5475221 (1995-12-01), Wang
patent: 5703692 (1997-12-01), McNeil et al.
patent: 5796512 (1998-08-01), Wachman et al.
patent: 5841577 (1998-11-01), Wachman et al.
patent: 5880838 (1999-03-01), Marx et al.
patent: 5963329 (1999-10-01), Conrad et al.
patent: 6608690 (2003-08-01), Niu et al.
patent: 6699624 (2004-03-01), Niu et al.
patent: 6704661 (2004-03-01), Opsal et al.
patent: 6721691 (2004-04-01), Bao et al.
patent: 6738138 (2004-05-01), Wei
patent: 6753961 (2004-06-01), Norton et al.
patent: 6768983 (2004-07-01), Jakatdar et al.
patent: 6772084 (2004-08-01), Bischoff et al.
patent: 6785638 (2004-08-01), Niu et al.
patent: 6813034 (2004-11-01), Rosencwaig et al.
patent: 6819426 (2004-11-01), Sezginer et al.
patent: 6856408 (2005-02-01), Raymond
patent: 6919964 (2005-07-01), Chu
patent: 6928628 (2005-08-01), Seligson et al.
patent: 6965431 (2005-11-01), Vo-Dinh et al.
patent: 6972852 (2005-12-01), Opsal et al.
patent: 6974962 (2005-12-01), Brill et al.
patent: 6987572 (2006-01-01), Lakkapragada et al.
patent: 7046376 (2006-05-01), Sezginer
patent: 7061615 (2006-06-01), Lowe-Webb
patent: 7061623 (2006-06-01), Davidson
patent: 7061627 (2006-06-01), Opsal et al.
patent: 7068363 (2006-06-01), Bevis et al.
patent: 7103402 (2006-09-01), Vo-Dinh
patent: 7317531 (2008-01-01), Mieher et al.
patent: 7433040 (2008-10-01), Mieher et al.
patent: 7564557 (2009-07-01), Mieher et al.
patent: 7570358 (2009-08-01), Den Boef
patent: 7663753 (2010-02-01), Mieher et al.
patent: 2002/0185608 (2002-12-01), Wieser
patent: 2004/0119970 (2004-06-01), Dusa et al.
patent: 2006/0033921 (2006-02-01), Den Boef et al.
patent: 2006/0066855 (2006-03-01), Boef et al.
patent: 2006/0126074 (2006-06-01), Van Der Werf et al.
patent: 2006/0139592 (2006-06-01), Den Boef et al.
patent: 1 148 390 (2001-10-01), None
patent: 1 372 040 (2003-12-01), None
patent: 1 372 040 (2003-12-01), None
patent: 2003-065955 (2003-03-01), None
patent: WO 95/17662 (1995-06-01), None
patent: WO 2004/053426 (2004-06-01), None
patent: WO 2004/076963 (2004-09-01), None
patent: WO 2004/079351 (2004-09-01), None
“Acoustooptical Tunable Filter”, 1996, Wolfram Research, http://scienceworld.wolfram.com/physics/AcoustoopticalTunableFilter.html.
“Acousto-Optical Tunable Filters”, Del Mar Ventures, May 4, 2004, http://www.sciner.com/Acousto-Optics/acoustooptical—tunable—filters.htm.
Fellers et al.,“ Acousto-Optic Tunable Filters (AOTFs),” Theory of Confocal Microspy, 2004, Olympus Corporation, Olympus Fluoview Resource Center: Acousto-Optic Tunable Filters, http://www.olympusfluoview.com/theory/aotfintro.html.
Spring et al., “Acousto-Optic Tunable Filters”, Interactive Java Tutorials, May 21, 2003, Molecular Expressions: Optical Microscopy Ptimer Physics of Light and Color, http://micro.magnet.fsu.edu/primer/java/fIlters/aotf/index.html.
Notice of Reasons for Rejection mailed Jul. 13, 2010 for Japanese Patent Application No. 2008-072791, 3 pgs.
English Abstract for Japanese Publication No. 2006-518942T published Aug. 17, 2006, 1 pg.
English Abstract for Japanese Publication No. 2006-509219T published Mar. 16, 2006, 1 pg.
English Abstract for Japanese Publication No. 2006-519395T published Aug. 24, 2006, 1 pg.
ASML Netherlands B.V.
Nguyen Sang
Sterne Kessler Goldstein & Fox P.L.L.C.
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