Radiant energy – Electron energy analysis
Patent
1988-05-30
1988-07-19
Anderson, Bruce C.
Radiant energy
Electron energy analysis
250396R, 250397, H01J 4948
Patent
active
047587229
ABSTRACT:
An angular resolved spectrometer is provided which is capable of analyzing the energy of charged particles from an analysis source and simultaneouosly obtaining spectra with a resolution of .+-.1.0.degree. for a range of angles of emission up to an order of 340.degree. in a single selected plane of emission. Concentric toroidal electrode sectors move charged particles with emission angles -.alpha..sub.o .ltoreq..alpha..ltoreq.+.alpha..sub.o, any .beta. angle, and a chosen energy, entering at a path midway of the inlet end of an open-ended annular toroidal-contoured passageway formed by said concentric toroidal sectors and between which an electrical field is arranged in operation to be established, so that charged particles with said energy and angles (.alpha.,.beta.) will be refocused such that those charged particles with differing .alpha. angles are strongly refocused but those charged particles with differing .beta. angles are only weakly refocused, thereby to retain the required .beta. angular information at the .alpha. focus plane and provide a focus of charged particles into ring form. A charged particles position-sensitive detector then registers the focus of charged particles in ring form and generates signal pulses determined by the position of arrival of the charged particles on the detector. Means which measures differences in arrival times of the signal pulses is preferably employed to determine the angle .beta. at which the charged particles were emitted from said analysis source.
REFERENCES:
patent: 3742214 (1973-06-01), Helmer et al.
Jost, K., "Novel Design of a `Spherical` Electron Spectrometer", Jour. Phys. E. Sci. Instruments, vol. 12, No. 10, Oct. 1979.
"A 304 .ANG. Photoelectron Spectrometer for Band Structure Studies", by Poole et al., in Vacuum, vol. 22, No. 10.
"A Soft X-Ray Source for Photoelectron Spectroscopy", by McLachlan et al. in Rev. Sci. Instrum., vol. 44, No. 7, Jul. 1973.
"A Novel Momentum-Resolving Multichanneling Electron and Ion Spectrometer", by Engelhardt et al., in the Proceedings of the Fourth International Conference on Solid Surfaces and the Third European Conference on Surface Science, vol. 2, Sep. 22-26, 1980.
"Novel Charged Particle Analyzer for Momentum Determination in the Multichanneling Mode: I. Design Aspects and Electron/Ion Optical Properties", by Engelhardt et al., in Rev. Sci. Instrum. 52(6), Jun. 1981.
"Novel Charged Particle Analyzer for Momentum Determination in the Multichanneling Mode: II. Physical Realization, Performance Tests, and Sample Spectra", by Engelhardt et al., in Rev. Sci. Instrum. 52(8), Aug. 19, 1981.
"Position-Sensitive Detector System for Angle-Resolved Electron Spectroscopy with a Cylindrical Mirror Analyzer", by Van Hoof et al. in J. Phys. E. Scil. Instrum., vol. 13, 1980, pp. 409-414.
"Vidicon-Camera Parallel-Detection System for Angle-Resolved Electron Spectroscopy", by Weeks et al., in Rev. Sci. Instrum., vol. 50, 1979, pp. 1249-1255.
"An Electron Spectrometer for Measuring both Angular and Energy Distributions of Photoemitted Electrons", in Rev. Sci. Instrum., vol. 45, No. 10, Oct. 1974, pp. 12-3-1207, article by Pauty et al.
"An Ellipsoidal Mirror Display Analyzer System for Electron Energy and Angular Measurements", by Eastman et al., in Nuclear Inst. and Meth., vol. 1/2 (1980), pp. 327-336.
"Microchannel Plate Detectors", by Joseph Ladislas Wiza, in Nucl. Inst. and Meths., vol. 162, 1979, pp. 587-601.
"High Resolution Position-Sensitive Detectors Using Microchannel Plates", in Nucl. Inst. and Meths., vol. 121 (1974), pp. 151-159.
Leckey Robert C. G.
Riley John D.
Anderson Bruce C.
Grigsby T. W.
La Trobe University
LandOfFree
Angular resolved spectrometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Angular resolved spectrometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Angular resolved spectrometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-598758