Angular positioning and calibration of projected reference light

Optics: measuring and testing – Angle measuring or angular axial alignment

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Details

172 45, 356152, 350623, G01B 1126

Patent

active

050338471

ABSTRACT:
A portion of first reference light plane is intercepted by a first one of a pair of angularly oriented reflective surfaces and reflected by the second of the pair of reflective surfaces as a second reference light plane at a selectable angle relative to the first reference light plane. The first and second reflective surfaces are movably mounted such that the first reflective surface can be rotated about a first axis coincident with or parallel to an incidence line in the first reflective surface which receives the first light plane and the second reflective surface can be rotated about a second axis parallel to but spaced from the first axis. The first and second reflective surfaces are mounted such that when the first reflective surface moves through an angle of a/2 degrees, the second reflective surface moves through an angle of a degrees. The first reflective surface is further mounted for rotation about a third axis coincident with or parallel to the first axis to vary the projection angle of the second reference light plane relative to the first reference light plane generator. Independent control of the rotational movement of the first reflective surface about the third axis serves to calibrate the pointing direction of the second light plane.

REFERENCES:
patent: 3813171 (1974-05-01), Teach et al.
patent: 3820903 (1974-06-01), Kindl et al.
patent: 4031629 (1977-06-01), Paluck
patent: 4035084 (1977-07-01), Ramsay
patent: 4062634 (1977-12-01), Rando et al.
patent: 4679937 (1987-07-01), Cain et al.
patent: 4836669 (1989-06-01), Teach

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