Optics: measuring and testing – Angle measuring or angular axial alignment
Patent
1975-04-21
1976-06-29
Corbin, John K.
Optics: measuring and testing
Angle measuring or angular axial alignment
324 97, 350285, G01B 1126
Patent
active
039663272
ABSTRACT:
An apparatus for measuring small angular displacement of any object having an attached light reflective surface. A reflecting mirror is attached to the test object for receiving a light beam from a light source and for reflecting the beam toward an angular excursion amplifier. A beam position detector is included in the angular excursion amplifier together with adjustable means for directing the beam toward the beam position sensor. A second beam is directed toward the angular excursion amplifier for impingement upon a reflector mounted upon the adjustable means in the angular excursion amplifier. The reflected second beam is directed toward a scale having a linear gradient calibrated in terms of angular excursion of the test object. In this fashion minute excursion angles of the test object are presented at the scale as amplified linear sweeps of the reflected second beam. One embodiment visualizes manual adjustment of the adjustable means in the angular excursion amplifier while another embodiment visualizes servoed adjustable means in the angular excursion amplifier. Means are provided for aligning the light beams with the angular excursion amplifier and the scale. The angular excursion amplifier is positioned at a relatively short predetermined distance from the test object.
REFERENCES:
patent: 2615367 (1952-10-01), Murray et al.
patent: 3845492 (1974-10-01), Tejada
Corbin John K.
Punter Wm. H.
Systron Donner Corporation
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