Angled lateral pocket implants on p-type semiconductor devices

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

148DIG18, H01L 21265

Patent

active

054098483

ABSTRACT:
The punchthrough capacity of a p-type semiconductor device is significantly improved by nonuniformly doping the p-channel with n-type implants such as phosphorus. The n-type dopants are implanted at large angles to form pocket implants within the channel region. The dose of the implants, angle of the implants and the thermal cycle annealing of the implants will be optimized for maximum punchthrough capability without substantially detracting from the performance of the semiconductor device.

REFERENCES:
patent: 3660735 (1972-05-01), McDougall
patent: 3914857 (1975-10-01), Goser et al.
patent: 4417385 (1983-11-01), Temple
patent: 4466178 (1984-08-01), Soclof
patent: 4613882 (1986-09-01), Pimbley et al.
patent: 4698899 (1987-10-01), Kakihana
patent: 4855247 (1989-08-01), Ma et al.
patent: 4931408 (1990-06-01), Hshieh
patent: 4963504 (1990-10-01), Huang
patent: 4975385 (1990-12-01), Beinglass et al.
patent: 4978626 (1990-12-01), Poon et al.
patent: 5045898 (1991-09-01), Chen et al.
patent: 5100810 (1992-03-01), Yoshimi et al.
patent: 5147811 (1992-09-01), Sakagami
patent: 5217910 (1993-06-01), Shimizu et al.
Wolf et al., vol. II, Silicon Processing for the VLSI Era, Lattice Press, 1990 pp. 370-385.
"A New Submicron MOSFET with LATID (Large-Tilt Angle Implanted Drain) Structure" Takashi Hori et al. pp. 15 & 16.
"Mechanism Analysis of A Highly Reliable Graded Junction Gate/N.sup.- Overlapped Structure in MOSLDD Transistor", Okumura et al, pp. 477-480, 1989.
"Angled Implant Fully Overlapped LDD(AI-FOLD) NFETs For Performance And Reliability" Bryant et al., pp. 152-157, 1989.
"1/4-.mu.m LATID (LA rge-Tilt-angle Implanted Drain) Technology For 3.3-V Operation", Hori et al., pp. 32.4.1-32.4.4, 1989.
"A New MOSFET with Large-Tilt-Angle Implanted Drain (LATID) Structure", Hori et al. 1988.
"Optimum Design of Gate/N Overlapped LDD Transistor", Inuishi et al., pp. 4-4-4-5.
A. Hori et al., IEEE Electron Device and Letters, 43 (1992) 174.
Y. Okumura et al., IEDM Tech. Dig. (1990) 391.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Angled lateral pocket implants on p-type semiconductor devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Angled lateral pocket implants on p-type semiconductor devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Angled lateral pocket implants on p-type semiconductor devices will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1567238

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.