Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1994-09-23
1996-08-13
Gonzalez, Frank
Optics: measuring and testing
By particle light scattering
With photocell detection
356346, 356358, G01B 902
Patent
active
055461859
ABSTRACT:
A laser beam from a laser beam oscillator is guided to an incidence light path of a beam splitter of a Michelson interferometer by means of a first guide mirror, reflected by a fixed mirror and a scanning mirror of the Michelson interferometer, and returned to the beam splitter, thus obtaining an interference light beam. The interference laser beam is guided to first and second laser beam detectors by means of a second guide mirror to detect variations in intensity of the interference laser beam. On the basis of the variations in intensity of the interference laser beam, an angle of inclination (.theta.) of the scanning mirror is measured.
REFERENCES:
patent: 4053231 (1977-10-01), Fletcher et al.
patent: 5133598 (1992-07-01), Badeau
Bliznyuk et al, "Automatic Photoheterodyne Interferometric System for Control of Optical Details", Sep. 87, Measurement techniques, pp. 870-873.
Patent Abstracts of Japan, vol. 9, No. 161, (P-370) (1884), Jul. 5, 1985, JP-A-60-038625, Feb. 28, 1985, Katsu Inoue.
Okumura Eisuke
Tsuno Katsuhiko
Gonzalez Frank
Kabushiki Kaisha Toshiba
Kim Robert
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