Analyzing probe

Details Analyzing probe Analyzing probe

1987-01-13

1988-03-22

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

With sample excitation

73DIG9, G01N 2167

Patent

active

047324775

ABSTRACT:
The present invention briefly refers to a device and a method for analyzing samples of molten charges inside the charges themselves. An analyzing probe (1) comprising a body (4) of ceramic material with an inlet for molten charge is provided in a tube (5) of board or the like and forms a disposable probe. A cavity (2a) is provided in the ceramic body (4) and the inlet (3) has a notch or the like towards the cavity for receiving molten charge. An electrode (10) is positioned in the cavity (2a) and upon application of electric current via the electrode (10) and the molten charge a spark or a luminous arc is ignited between the electrode (10) and the portion of the sample of the molten charge adjacent the notch. A light-conducting body (8) is provided in the cavity adjacent the luminous arc or sparks for collecting light emitting therefrom.

REFERENCES:
patent: 3645628 (1978-02-01), Bojic et al.
patent: 3659944 (1972-05-01), Bojic
patent: 4037478 (1977-07-01), Cure
patent: 4102197 (1978-07-01), Bardenheuer et al.

Affiliated with

Also associated with

Rating

Analyzing probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Analyzing probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Analyzing probe will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-439146