Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2004-10-07
2008-12-09
Nghiem, Michael P (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
Reexamination Certificate
active
07464006
ABSTRACT:
An apparatus, computer program product and method of analyzing non-stationary time varying phenomena. A representation of a non-stationary time varying phenomenon is recursively sifted using Empirical Mode Decomposition (EMD) to extract intrinsic mode functions (IMFs). The representation is filtered to extract intrinsic trends by combining a number of IMFs. The intrinsic trend is inherent in the data and identifies an IMF indicating the variability of the phenomena. The trend also may be used to detrend the data.
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patent: 2004/0078160 (2004-04-01), Frei et al.
patent: 2007/0030002 (2007-02-01), Frei et al.
Edwards Christopher O.
Nghiem Michael P
The United States of America as represented by the Administrator
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