Analyzing electrical circuit boards

Details Analyzing electrical circuit boards Analyzing electrical circuit boards

1978-02-21

1979-12-18

Krawczewicz, Stanley T.

Electricity: measuring and testing

Conductor identification or location

Inaccessible

324 62, 324 65CP, 324 73PC, 324158P, 339108TP, G01R 2714

Patent

active

041796527

ABSTRACT:
Analyzing electrical circuit boards by providing a probe having at least two contact tips close enough to each other to simultaneously contact a lead of a mounted integrated circuit element, but spaced apart from each other sufficiently to permit measurement of electrical activity in the lead segment between the tips; and measuring the voltage drop between the tips resulting from the flow of test current through the resistance of the lead segment. In preferred embodiments the test current is injected directly into the lead through a third tip of the probe while the third tip is in contact with the lead at a point farther from the IC than the other two tips.

REFERENCES:
patent: 3048776 (1962-08-01), Logan
patent: 3735254 (1973-05-01), Severin
patent: 3996514 (1976-12-01), Brown et al.
Shumann, Jr. et al., Measurement Electronics for the Three-Point Probe, Solid State Technology, Nov. 1968, pp. 32-36.
Chalfin et al., Voltage Mode Spreading Resistance Measurement, IBM Technical Disclosure Bull., Oct. 1970, pp. 1369 & 1370.
Bell et al., A Computer Based, Four Terminal Impedance Measuring System for Low Frequencies, Journal of Physics, Jan. 1975, pp. 66-70.

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