Analyzing apparatus and fine particle collecting apparatus

Measuring and testing – Sampler – sample handling – etc. – Capture device

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C073S864000

Reexamination Certificate

active

10773743

ABSTRACT:
A simple and convenient analyzing apparatus is provided which easily, conveniently, and efficiently collects a material in the state of fine particles adhered to a target object, extracts the object to be analyzed, and analyzes the extracted object. An apparatus for detecting fine particles in a gas which sucks the gas under measurement from the target object by using a suction pump, extracts the fine particles contained in the gas under measurement, and performs measurement by using a spectrometer is embodied such that an inertial impactor for collecting the fine particles having diameters not less than a specified particle diameter is disposed upstream of the spectrometer, the fine particles are collected in the fine particle collector of the inertial impactor, the collector containing the collected fine particles is heated such that the collected fine particles are vaporized into a gas, and the vaporized fluid to be examined is supplied to the spectrometer to be measured thereby.

REFERENCES:
patent: 3908969 (1975-09-01), Baum et al.
patent: 3998626 (1976-12-01), Baum et al.
patent: 5425263 (1995-06-01), Davies et al.
patent: 5465607 (1995-11-01), Corrigan et al.
patent: 5854431 (1998-12-01), Linker et al.
patent: 5964985 (1999-10-01), Wootten
patent: 6013158 (2000-01-01), Wootten
patent: 6334365 (2002-01-01), Linker et al.
patent: 6408701 (2002-06-01), Fujita
patent: 0447158 (1991-09-01), None
patent: 0896213 (1999-02-01), None
patent: 2376873 (2002-12-01), None
patent: 2002-005811 (2002-01-01), None
patent: WO98/43063 (1998-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Analyzing apparatus and fine particle collecting apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Analyzing apparatus and fine particle collecting apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Analyzing apparatus and fine particle collecting apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3898963

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.