Image analysis – Applications – Manufacturing or product inspection
Patent
1998-01-16
2000-04-25
Au, Amelia
Image analysis
Applications
Manufacturing or product inspection
382286, 382197, G06K 900
Patent
active
060553286
ABSTRACT:
An acquired arrangement of object locations is analyzed. The acquired arrangement imperfectly conforms to an ideal arrangement of points. Sets of vectors are found in the acquired arrangement. A composite set of vectors is derived from the sets of vectors.
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Au Amelia
Bali Vikkram
Cognex Corporation
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