Analyzation apparatus and control method thereof

Data processing: structural design – modeling – simulation – and em – Simulating nonelectrical device or system

Reexamination Certificate

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C703S002000, C345S420000, C345S592000

Reexamination Certificate

active

08041549

ABSTRACT:
An analyzation apparatus which performs an analysis simulation in accordance with analysis condition data. An analysis condition modeling unit generates an analysis condition model data by assigning an analysis condition to each region of a three-dimensional model represented with analysis object model data of the analysis simulation based on analysis condition data set for the analysis simulation. A rendering unit renders the three-dimensional model represented with the analysis condition model data and displays the three-dimensional model on a display device.

REFERENCES:
patent: 7292255 (2007-11-01), Doan et al.
patent: 07-254003 (1995-10-01), None
Djurcilov et al. “Visualizing scalar volumetric data with uncertainty” 2002, Computers & Graphics, vol. 26, pp. 239-248.
Jones, Derek K. “Determining and Visualizing Uncertainty in Estimates of Fiber Orientation From Diffusion Tensor MRI”, 2003, Magnetic Resonance in Medicine, vol. 49, pp. 7-12.
Pang, Alex. “Visualizing Uncertainty in Geo-spatial Data”, Sep. 20, 2001, 14 pages.
MacEachren et al. “Visualizing Geospatial Information Uncertainty: What We Know and What We Need to Know”, 2005, Cartography and Geographic Information Science, vol. 32, No. 3, pp. 139-160.
Newman et al. “On visualizing uncertainty in volumetric data: techniques and their evaluation”, 2004, Journal of Visual Languages and Computing vol. 15, pp. 463-491.
Alshoaibi et al. “Finite element simulation of stress intensity factors in elastic-plastic crack growth” Journal of Zhejiang University Science A, 2006, vol. 7, No. 8, pp. 1336-1342.
Cho et al. “A management on mesh modelling for finite element analysis in casting simulation” Jan.-Feb. 2007, Journal of Achievements in MAterials and Manufacturing Engineering, vol. 20, Issues 1-2, pp. 335-338.

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