Analytical sensor using grating light reflection spectroscopy

Details Analytical sensor using grating light reflection spectroscopy Analytical sensor using grating light reflection spectroscopy

1994-07-22

1996-03-26

Evans, F. L.

Optics: measuring and testing

Refraction testing

356328, G01N 2141, G01J 342

Patent

active

055025609

ABSTRACT:
A optical analytical method and apparatus for measuring concentrations of materials in liquids and gases is described. The method is based upon measurements of light reflection from diffraction gratings in contact with the sample. Features in the reflection spectrum are directly related to the complex dielectric constant of the sample solution. By examining the reflection spectrum, the concentration of materials in the liquid or gas can be determined.

REFERENCES:
patent: 3702736 (1972-11-01), Coggeshall
patent: 4436420 (1984-03-01), Depp et al.
patent: 4715715 (1987-12-01), Howarth et al.
Nafarrate, IBM Technical Disclosure Bulletin, vol. 13, No. 1, Jun. 1970, p. 121.

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