Analytical method using modified scanning probes

Details Analytical method using modified scanning probes Analytical method using modified scanning probes

1997-03-17

1998-06-09

Williams, Hezron E.

Measuring and testing

Surface and cutting edge testing

Roughness

G01B 528, G01N 3350

Patent

active

057637687

ABSTRACT:
The present invention provides a method of analyzing for a specific material in a sample using a sensor including a resonating member having resonating properties. The resonating member has a probe and a known material is disposed on or forms the probe. The method includes the steps of positioning the sensor proximate to the sample, detecting a force dependent change in the resonance properties of the sensor, and confirming the presence of the specific material based on the identity of the known material and the detection of a resonance change.

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patent: 5372930 (1994-12-01), Colton et al.
patent: 5519212 (1996-05-01), Elings et al.
patent: 5624845 (1997-04-01), Wickramasinghe et al.
Erlandsson et al., "Scanning Force Microscopy--Examples of Applications to Surface Chemistry", received Jun. 1992, pp. 1-21.
Nakagawa et al., "Discriminating Molecular Length of Chemically Adsorbed Molecules Using an Atomic Force Microscope Having a Tip Covered with Sensor Molecules (An Atomic Force Microscope Having Chemical Sensing Function)", Jpn. J. Appl. Phys., vol. 32, P.

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