Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent
1996-08-29
1998-05-12
Font, Frank G.
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
356300, 356318, 356417, E01J 330
Patent
active
057514160
ABSTRACT:
The invention relates to an analytical method using laser-induced breakdown spectroscopy.
REFERENCES:
patent: 4561777 (1985-12-01), Radziemski et al.
patent: 4986658 (1991-01-01), Kim
patent: 4993834 (1991-02-01), Carlhoff et al.
patent: 4995723 (1991-02-01), Carlhoff et al.
patent: 5091652 (1992-02-01), Mathies et al.
patent: 5256852 (1993-10-01), Boudot
patent: 5446538 (1995-08-01), Noll
patent: 5469255 (1995-11-01), Kamada et al.
patent: 5608519 (1997-03-01), Gourloy et al.
Chen Yu Huang et al., Preprint Extended Abstract, Presented at the I&EC Special Symposium American Chemical Society, Trace Analysis of Toxic Metals in Air by Lase Induced Breakdown Spectroscopy, 4 pp., Sep. 17-20, 1995.
Jagdish P. Singh et al., Proceedings of the International Symposium on Environmental Technologies: Plasma Systems and Applications, Application to Toxic Metal Concentration Measurements in a Plasma Torch Off-Gas Emission System, Oct. 8-11, 1995, pp. 409-420.
Claus J. Lorenzen et al., Journal of Analytical Atomic Spectrometry, Applications of Laser-induced Emission Spectral Analysis for Industrial Process and Quality Control, Sep. 1992, vol. 7, pp. 1029-1035.
Cook Robert L.
Singh Jagdish P.
Yueh Fang-Yu
Zhang Hansheng
Font Frank G.
Mississippi State University
Ratliff Reginald A.
LandOfFree
Analytical method using laser-induced breakdown spectroscopy does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Analytical method using laser-induced breakdown spectroscopy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Analytical method using laser-induced breakdown spectroscopy will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-987094