Analytical method for particulate silicon

Details Analytical method for particulate silicon Analytical method for particulate silicon

1990-11-15

1995-07-25

Snay, Jeffrey R.

Chemistry: analytical and immunological testing

Silicon containing

436 73, 436103, 436145, 436171, 436172, 436174, 117 38, 117 49, G01N 2135, G01N 2164, C30B 1314

Patent

active

054361648

ABSTRACT:
The instant invention is a method for converting particulate silicon into monocrystalline silicon suitable for the determination of contaminates present in the particulate silicon. The method uses a silicon vessel, with known levels of the contaminates to be determined, to contain the particulate silicon. The silicon vessel, containing the particulate silicon, is float-zone processed to form a monolithic unit of monocrystalline silicon. The concentration of contaminates in the monocrystalline silicon can then be determined by the more sensitive analytical methods known for analysis of monolithic, monocrystalline silicon. The instant method is especially useful for measuring very low levels of aluminum, boron, phosphorous, and carbon in particulate silicon.

REFERENCES:
patent: 2907642 (1959-10-01), Rummel
patent: 2930098 (1960-03-01), Emeis
patent: 3156533 (1964-11-01), Imber
patent: 4200621 (1980-04-01), Liaw et al.
patent: 4572668 (1986-02-01), Auth
patent: 4602979 (1986-07-01), Marshall et al.
patent: 4809196 (1989-02-01), Miller

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